Publications

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Sinha, A., O. S. Sastry, and R. Gupta. "Nondestructive characterization of encapsulant discoloration effects in crystalline-silicon PV modules." Solar Energy Materials and Solar Cells 155 (2016): 234-242.
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Wu, X., M. Bliss, T. Betts, R. Gottschalg, A. Sinha, and R. Gupta. "Modeling spatial electrical properties in photovoltaic modules using PV-oriented nodal analysis." In IECON Proceedings (Industrial Electronics Conference), 8098-8103., 2013.
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Somasundaran, P., and R. Gupta. "Influence of local shunting on the electrical performance in industrial Silicon solar cells." Solar Energy 139 (2016): 581-590.
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Somasundaran, P., and R. Gupta. "Evaluation of Shunt Losses in Industrial Silicon Solar Cells." International Journal of Photoenergy 2016 (2016).
Gupta, R., P. Somasundaran, and D. K. Nandi. "Electrical simulation and characterization of shunts in solar cells." Applied Mechanics and Materials 110-116 (2012): 2453-2457.
Sinha, A., and R. Gupta. "Effects of different excitation waveforms on detection and characterisation of delamination in PV modules by active infrared thermography." Nondestructive Testing and Evaluation (2016): 1-17.
Magare, D. B., O. S. Sastry, R. Gupta, T. R. Betts, R. Gottschalg, A. Kumar, B. Bora, and Y. K. Singh. "Effect of seasonal spectral variations on performance of three different photovoltaic technologies in India." International Journal of Energy and Environmental Engineering 7 (2016): 93-103.
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Wu, X., M. Bliss, A. Sinha, T. Betts, R. Gupta, and R. Gottschalg. "Distributed electrical network modelling approach for spatially resolved characterisation of photovoltaic modules." IET Renewable Power Generation 8 (2014): 459-466.
Sinha, A., O. S. Sastry, and R. Gupta. "Detection and characterisation of delamination in PV modules by active infrared thermography." Nondestructive Testing and Evaluation 31 (2016): 1-16.
A
Wu, X., M. Bliss, A. Sinha, T. R. Betts, R. Gupta, and R. Gottschalg. "Accelerated spatially resolved electrical simulation of photovoltaic devices using photovoltaic-oriented nodal analysis." IEEE Transactions on Electron Devices 62 (2015): 1390-1398.

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