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Non-destructive approach for severity investigation of shunts in crystalline silicon photovoltaic modules by combination of electroluminescence imaging and lock-in thermography
Thu, 2021-07-22 16:11 — venkatr
| Title | Non-destructive approach for severity investigation of shunts in crystalline silicon photovoltaic modules by combination of electroluminescence imaging and lock-in thermography |
| Publication Type | Journal Article |
| Year of Publication | 2019 |
| Authors | Roy, S., and R. Gupta |
| Journal | Measurement Science and Technology |
| Volume | 30 |
| URL | https://www.scopus.com/inward/record.uri?eid=2-s2.0-85063931602&doi=10.1088%2f1361-6501%2fab0265&partnerID=40&md5=d97a6953d365193ca05b84eb9cc6098a |
| DOI | 10.1088/1361-6501/ab0265 |