Non-destructive approach for severity investigation of shunts in crystalline silicon photovoltaic modules by combination of electroluminescence imaging and lock-in thermography

TitleNon-destructive approach for severity investigation of shunts in crystalline silicon photovoltaic modules by combination of electroluminescence imaging and lock-in thermography
Publication TypeJournal Article
Year of Publication2019
AuthorsRoy, S., and R. Gupta
JournalMeasurement Science and Technology
Volume30
URLhttps://www.scopus.com/inward/record.uri?eid=2-s2.0-85063931602&doi=10.1088%2f1361-6501%2fab0265&partnerID=40&md5=d97a6953d365193ca05b84eb9cc6098a
DOI10.1088/1361-6501/ab0265